Distinctions and Awards

  • Best Paper Award of 12th ACM/IEEE International Symposium on Nanoscale Architectures (IEEE Nanoarch), 2016
  • Best Paper Award of IEEE/ACM “Design, Automation and Test in Europe 2015” (IEEE DATE 2015). Acceptance rate – 28%
  • IEEE Computer Society/TTTC Award for the Most Populous Conference organized in 2012
  • Outstanding Paper Award, conference IEEE/IPRS – International Reliability Physics Symposium, 2012
  • The Most Influential Papers of the Ten Years of IEEE DATE Conference – Anghel. M. Nicolaidis, “Cost Reduction and Evaluation of a Temporary Faults Detecting Technique”, 2008, XII, 516 p, ISBN: 978-1-4020-6487-6
  • IEEE Computer Society, Continuing Service Award, en 2005
  • Best Paper Award IEEE/CS “VLSI Test Symposium 2004”, (VTS 2004). Acceptance rate 20-30%
  • IEEE Computer Society, Certificate of Appreciation en 2003 and 2004
  • Best Paper Award of IEEE/ACM “Design, Automation and Test in Europe 2000” (IEEE DATE 2000). Acceptance rate – 20-30%
  • Best Phd Thesis Award in Microelectronics in 2000, at Grenoble Institute of Technolgy